# Ellipsometry: Basic help

by McLaren Rulez
Tags: basic, ellipsometry
 P: 261 This is from a paper that can be found at http://www.opticsinfobase.org/ao/abs...=ao-26-24-5221 (needs a university proxy/payment to view) The setup is essentially light passing through a polarizer, a thin film sample and then an analyzer followed by a detector. The analyzer is a second polarizer that can be rotated. The paper starts with an expression for the intensity of the light from the analyzer. $I=k_{0}+k_{1}cos2A+k_{2}sin2A$ where $k_{0}=n(cos^{2}P+tan^{2}\psi sin^{2}P)$ $k_{1}=n(cos^{2}P-tan^{2}\psi sin^{2}P)$ $k_{2}=n*tan\psi*sin2P*cos\Delta$ where n is an arbitrary factor that relates to the intensity of the light, P and A are the angle of the polarizer and analyzer respectively from the with respect to the plane of incidence and the reflection coefficients of the s and p components of the light from the sample are related by $\frac{r_{p}}{r_{s}}=tan\psi * e^{i\Delta}$ Can anyone help me see how this intensity relation is obtained? It is just polarizers and reflections but I'm having trouble seeing how it is derived. Thank you.

 Related Discussions Atomic, Solid State, Comp. Physics 0 General Physics 0 Classical Physics 0 Advanced Physics Homework 2 Atomic, Solid State, Comp. Physics 1