X-Ray Spectroscopy: Calculating Wavelength & Angle

In summary, the energy of an x-ray photon with a characteristic energy of 2.320keV can be converted to a wavelength of 535.24nm. The angle at which you would set a WD spectrometer containing an ADP dispersing crystal with an effective d spacing of 10.64A is 3.19°.
  • #1
Scarpetta
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0
An x-ray photon has a characteristic energy of 2.320keV. Determine its equivalent wavelenth in nm and the angle at which you would set a WD spectrometer containing an ADP dispersing crystal with an effective d spacing of 10.64A.

I would appreciate any help on this question please, i don't expect to be given the answers but if some one could show some example calcs or tell me where i can find some i would be very grateful, I've been on the web all day and not had any luck, please help!

Thanks

Scarpetta
 
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  • #2
Wavelength in nm: The energy of an x-ray photon can be converted to its equivalent wavelength in nm using the equation E = hc/λ, where h is Planck's constant (6.626 × 10^-34 J s), c is the speed of light (2.998 x 10^8 m/s) and λ is the wavelength in nm. E = (6.626 x 10^-34 J s)(2.998 x 10^8 m/s)/λ λ = (6.626 x 10^-34 J s)(2.998 x 10^8 m/s)/2.320keV λ = 535.24 nm Angle at which you would set the WD spectrometer: The angle at which you would set a WD spectrometer containing an ADP dispersing crystal with an effective d spacing of 10.64A can be determined using the equation θ = 2Δ/λ, where Δ is the effective d spacing of the crystal (10.64A) and λ is the wavelength of the x-ray photon (535.24nm). θ = 2(10.64A)/535.24nm θ = 0.0553 rad = 3.19°
 
  • #3


To calculate the wavelength of the x-ray photon with an energy of 2.320keV, we can use the equation E = hc/λ, where E is the energy, h is Planck's constant (6.626 x 10^-34 J*s), c is the speed of light (3.00 x 10^8 m/s), and λ is the wavelength.

First, we need to convert the energy from keV to Joules by multiplying by 1.602 x 10^-16. So, 2.320keV is equivalent to 3.718 x 10^-16 J.

Next, we can plug in the values into the equation to solve for the wavelength:

3.718 x 10^-16 J = (6.626 x 10^-34 J*s)(3.00 x 10^8 m/s)/λ

Rearranging the equation to solve for λ, we get:

λ = (6.626 x 10^-34 J*s)(3.00 x 10^8 m/s)/3.718 x 10^-16 J

λ = 1.34 x 10^-10 m

Finally, we can convert this to nanometers by multiplying by 10^9, giving us a wavelength of 134nm for the x-ray photon.

To determine the angle at which we would set a WD spectrometer containing an ADP dispersing crystal with an effective d spacing of 10.64A, we can use the Bragg's Law equation, nλ = 2dsinθ, where n is the order of diffraction, λ is the wavelength, d is the distance between crystal planes, and θ is the angle of incidence.

In this case, n = 1 (first order diffraction), λ = 1.34 x 10^-10 m (calculated above), d = 10.64A = 10.64 x 10^-10 m.

Plugging in the values, we get:

1.34 x 10^-10 m = 2(10.64 x 10^-10 m)sinθ

Solving for θ, we get:

θ = sin^-1(1.34 x 10^-10 m/2(10.64 x 10^-10 m))

θ = 6.31°

Therefore, the angle at which we would set the WD spectrometer is
 

1. What is X-Ray Spectroscopy?

X-Ray Spectroscopy is a technique used to analyze the composition and properties of materials by measuring the wavelengths of X-rays emitted or absorbed by the material.

2. How is the wavelength of X-rays calculated in X-Ray Spectroscopy?

The wavelength of X-rays is calculated using the equation λ = hc/E, where λ is the wavelength, h is Planck's constant, c is the speed of light, and E is the energy of the X-ray.

3. What is the role of angle in X-Ray Spectroscopy?

The angle in X-Ray Spectroscopy refers to the angle at which the X-rays are directed onto the material. This angle affects the diffraction pattern and can be used to determine the crystal structure of the material.

4. How does X-Ray Spectroscopy help in identifying elements in a material?

X-Ray Spectroscopy allows us to measure the characteristic X-ray emission or absorption lines of specific elements. By comparing these lines to known values, we can identify the elements present in the material.

5. What are the practical applications of X-Ray Spectroscopy?

X-Ray Spectroscopy is used in a wide range of fields such as material science, chemistry, biology, and geology. It can be used to analyze the composition of materials, determine crystal structures, and study the electronic properties of materials. It has applications in medicine, forensics, and industrial quality control as well.

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