Why do s and p polarized lights have different phase shifts in ellipsometry?

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In summary, the complex reflectance ratio in ellipsometry theory is expressed as a function of tan(\Psi) and \Delta, where tan(\Psi) represents the amplitude ratio upon reflection and \Delta represents the phase shift. While phase shifts of \pi and 0 occur at normal incidence for s or p polarized light, ellipsometry uses oblique angles of reflection and compares the phase shifts of the two polarized states. This results in differences in phase shifts for s and p polarized light.
  • #1
geo_alchemist
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Here is my situation:
According to ellipsometry theory the complex reflectance ratio can be expressed as
[PLAIN]http://img255.imageshack.us/img255/2657/68578079.png
where tan([tex]\Psi[/tex]) is the amplitude ratio upon reflection and [tex]\Delta[/tex] is a phase shift.
On the other hand, as far as I now, phase shift upon reflection is [tex]\pi[/tex] or 0, depending on materials.
the question: is the [tex]\Psi[/tex] only variable that is being changed in wide range while [tex]\Delta[/tex] is either [tex]\pi[/tex] or 0 in all cases.

Sorry for not following subforum format, I just could not fit my question in it.
 
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Phase shifts of pi and 0 occur at normal incidence for s or p polarized light. Ellipsometry uses oblique angles of reflections and compares the phase shifts after reflection of the two states of polarized light. See the below link for a brief tutorial of ellipsometry.

http://www.jawoollam.com/tutorial_1.html
 
  • #3


So it turnes out that s and p polarized lights are phase shifted differently upon reflection.
but why? :uhh:
 

1. What is ellipsometry and why is it important?

Ellipsometry is an optical technique used to measure the change in polarization of light as it interacts with a sample. It is important because it provides information about the physical and structural properties of materials, which can be used in a variety of scientific fields such as physics, chemistry, and materials science.

2. What are the main components of an ellipsometer?

The main components of an ellipsometer include a light source, polarizers, a sample stage, and a detector. The light source emits polarized light, which is then passed through polarizers to control the polarization state of the light. The sample stage holds the sample and allows for precise control of its orientation. The detector measures the change in polarization of the light after it interacts with the sample.

3. How does ellipsometry work?

Ellipsometry works by measuring the change in polarization of light as it reflects off of a sample. The light is polarized and directed onto the sample at a specific angle. As it reflects off the sample, its polarization state changes, and this change is measured by the detector. The data collected can then be analyzed to determine the optical properties and thickness of the sample.

4. What are some common applications of ellipsometry?

Ellipsometry has a wide range of applications, including thin film characterization, surface analysis, and material identification. It is commonly used in the semiconductor industry for quality control and process monitoring. It is also used in the development and testing of new materials, such as solar cells and coatings.

5. Are there any limitations to using ellipsometry?

One limitation of ellipsometry is that it only provides information about the surface of a sample, so it is not suitable for analyzing materials with complex internal structures. It also requires specialized equipment and expertise, which can be costly. Additionally, ellipsometry is limited to measuring samples with smooth, flat surfaces, as rough or textured surfaces can affect the accuracy of the measurements.

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