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kimmylsm
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will thickness of a thin film affect the result of xrd? if too thin, will not get the best result?
kimmylsm said:will thickness of a thin film affect the result of xrd? if too thin, will not get the best result?
The thickness of a thin film can be measured using X-ray reflectometry (XRR) or X-ray diffraction (XRD) techniques. XRR measures the intensity of reflected X-rays at different angles to calculate the film thickness, while XRD measures the diffraction pattern of X-rays passing through the film to determine its thickness.
No, XRD is limited to measuring the thickness of thin films that are crystalline in nature. Amorphous and polycrystalline films cannot be accurately measured using XRD.
The accuracy of XRD measurements for thin film thickness can be affected by factors such as the crystal structure and orientation of the film, the quality of the film surface, and the beam divergence of the X-rays.
Yes, XRD is a non-destructive technique as it does not require physical contact with the sample and does not alter the structure or properties of the thin film being measured.
Yes, the accuracy of XRD measurements for thin film thickness is limited by the precision of the instrument, the sample preparation technique, and the assumptions made in the mathematical calculations used to determine the thickness.