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JayKo
- 128
- 0
how to determine the resolution power of it? has it got anything to do with correlation wavelength? just wondering how it is calculated?
Atomic force microscopy (AFM) is a type of scanning probe microscopy that uses a small probe to scan the surface of a sample at the atomic level. It measures the interaction forces between the probe and the sample surface to create a high-resolution image of the sample's surface topography.
AFM works by scanning a sharp probe over the surface of a sample. The probe is attached to a cantilever, which is used to measure the forces between the probe and the sample. These forces are then converted into a topographical image of the sample's surface.
AFM has several advantages over other types of microscopy, including its ability to image surfaces at the atomic level, its high resolution, and its ability to operate in various environments (such as air, liquid, or vacuum). It also does not require extensive sample preparation, making it a quick and easy technique to use.
One of the main limitations of AFM is its slow scanning speed, which can make imaging large samples time-consuming. It also has a smaller field of view compared to other types of microscopy, and it is sensitive to vibrations and other external factors that can affect the accuracy of the images.
AFM has a wide range of applications in various fields, including material science, biology, nanotechnology, and surface chemistry. It is commonly used to study surface topography, measure surface roughness, and characterize surface properties. It is also used in the development and testing of new materials and in the analysis of biological samples.