kleinwolf said:I thought ions were atoms without a certain number of electron less..until you have no electrons anymore...so could it be possible to ionize a surface (for example with laser beams or other electrical fields?) But then the problem above remains to overcome the coulomb repulsion.
This is impossible (and it doesn't exist ,as Zz's covered). You want to pluck out an individual nucleon from a substrate nucleus, attach this nucleon to a nucleus on the probe tip and deliver this extra nucleon to the substrate at a different location. You are trying to achieve a nuclear transmutation at the tip of an STM-type device ! Do you have any idea of the energy scales involved ? We're talking about the strong-interaction here...not EM forces.kleinwolf said:Does anybody know if the nuclear force microscope exists, where one could remove or put 1 nucleon at a time into an exisiting nucleus ?
A nuclear force microscope is a type of scanning probe microscope that uses a tiny, sharp tip to scan the surface of a material and measure the attractive forces between atoms. This allows for imaging and manipulation of materials at the atomic scale.
A nuclear force microscope works by scanning a tiny, sharp tip over the surface of a material. As the tip gets close to the atoms on the surface, the nuclear force between the atoms and the tip causes the tip to deflect. This deflection is measured and used to create an image of the surface.
Nuclear force microscopes have several advantages, including the ability to image and manipulate materials at the atomic scale, high resolution imaging capabilities, and the ability to work in various environments such as air, vacuum, or liquid.
Nuclear force microscopes have a wide range of applications, including materials science, nanotechnology, biology, and chemistry. They can be used to study the surface properties of materials, measure mechanical and electrical properties, and manipulate individual atoms and molecules.
While nuclear force microscopes have many advantages, they also have some limitations. These include the need for a conductive or atomically flat surface, the potential for damaging the sample with the sharp tip, and the complexity and cost of the equipment.