Silicon Dioxide (SiO2) FTIR peaks

In summary, Silicon Dioxide (SiO2) is a chemical compound composed of silicon and oxygen atoms in a 1:2 ratio, commonly found in nature as quartz and a major component of sand and rocks. FTIR (Fourier Transform Infrared) peaks are specific wavelengths of light that are absorbed by a material, and when analyzing SiO2, they correspond to the specific vibrations of the Si-O bonds in the molecule, providing information about its molecular structure. The main FTIR peaks of SiO2 are typically found at 800 cm-1, 1050 cm-1, and 1100 cm-1, corresponding to the stretching vibrations of the Si-O bonds. These peaks can also be used to identify imp
  • #1
physiks2011
2
0
Hi,
i am looking for the SiO2 FTIR peaks.

Thanks
 
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  • #2
Hi,
I think you can refer this paper by M. Hirose et al...In this paper, there was an analysis of Si-O-Si vibration from ATR result. I think the number of wavenumbers of FTIR and ATR is similar around 1220cm-1.

Microelectronic Engineering 22 (1993) 3-10
Elsevier
Ultra-Thin Gate Oxide Growth on Hydrogen-Terminated
Silicon Surfaces
 

1. What is the chemical composition of Silicon Dioxide (SiO2)?

Silicon Dioxide (SiO2) is a chemical compound composed of silicon and oxygen atoms in a 1:2 ratio. It is commonly found in nature as quartz and is a major component of sand and rocks.

2. What are FTIR peaks and how are they used to analyze Silicon Dioxide (SiO2)?

FTIR (Fourier Transform Infrared) peaks are specific wavelengths of light that are absorbed by a material. When analyzing Silicon Dioxide (SiO2) using FTIR, the peaks correspond to the specific vibrations of the Si-O bonds in the molecule, providing information about the molecular structure of SiO2.

3. What are the main FTIR peaks of Silicon Dioxide (SiO2)?

The main FTIR peaks of Silicon Dioxide (SiO2) are typically found at 800 cm-1, 1050 cm-1, and 1100 cm-1. These peaks correspond to the stretching vibrations of the Si-O bonds in the molecule.

4. How can FTIR peaks of Silicon Dioxide (SiO2) be used to identify impurities?

When analyzing a sample of Silicon Dioxide (SiO2) using FTIR, any additional peaks that do not correspond to the main Si-O bond vibrations can indicate the presence of impurities in the sample. These impurities may alter the molecular structure of SiO2 and can be identified through their unique FTIR peaks.

5. Can the intensity of FTIR peaks provide information about the concentration of Silicon Dioxide (SiO2) in a sample?

Yes, the intensity of FTIR peaks can be used to determine the concentration of Silicon Dioxide (SiO2) in a sample. The more intense the peak, the higher the concentration of SiO2 in the sample. However, this method may not be accurate for samples with a high concentration of impurities or for complex mixtures containing other compounds with similar FTIR peaks.

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