Frequency is used as the x-axis in an intensity-wavelength graph for emission spectra because it is a more precise and direct measurement of the energy of the emitted radiation. The frequency of light is directly proportional to its energy, according to the equation E=hf, where E is energy, h is Planck's constant, and f is frequency. This allows for a more accurate representation of the energy levels of the emitted radiation compared to using wavelength as the x-axis.
Frequency and wavelength are inversely related in an intensity-wavelength graph for emission spectra. This means that as the frequency of the emitted radiation increases, the wavelength decreases, and vice versa. This relationship is known as the wave-particle duality of light, as light exhibits both wave-like and particle-like properties.
The intensity of the emitted radiation is represented on the y-axis because it is a measure of the amount of energy being emitted per unit time. By plotting intensity on the y-axis, we can see the relative strength of the different energy levels of the emitted radiation and compare it to other spectra.
An intensity-wavelength graph for emission spectra is useful in identifying elements because each element has a unique emission spectrum due to the specific energy levels of its electrons. By comparing the intensity and wavelengths of the spectral lines on the graph to known spectra of elements, we can determine the presence of specific elements in a sample.
Yes, an intensity-wavelength graph for emission spectra can be used to determine the temperature of a source. This is because the intensity of the emitted radiation is directly related to the temperature of the source, according to the Stefan-Boltzmann law. The hotter the source, the higher the intensity of the emitted radiation, which can be seen on the y-axis of the graph. By analyzing the intensity of the spectral lines, we can estimate the temperature of the source.