How Can We Accurately Characterize Rough Surfaces in Epitaxial Systems?

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Discussion Overview

The discussion revolves around methods for accurately characterizing rough surfaces in epitaxial systems, focusing on theoretical techniques for analyzing surface measurements. Participants explore various measurement approaches and their reliability in distinguishing between different growth processes.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant suggests using power spectrum and wavelet analysis for surface characterization, noting their potential unreliability due to similar power spectra from different processes.
  • Another participant proposes several established techniques for surface characterization, including auger spectroscopy, STM, XPS, and SIMS, but does not directly address the theoretical analysis aspect.
  • A participant expresses a desire for theoretical techniques to analyze height measurements of rough surfaces, specifically comparing experimental data with computer-generated surfaces.
  • Fractal analysis is mentioned as a method used by Mandelbrot to characterize roughness, although the details of its application are not provided.
  • A participant references a discussion with Mandelbrot about using Hurst analysis, expressing skepticism about its effectiveness in distinguishing between different straight lines on a log-log plot.

Areas of Agreement / Disagreement

Participants do not reach a consensus on the best methods for characterizing rough surfaces, with multiple competing views and techniques being proposed. The discussion remains unresolved regarding the most effective theoretical approaches.

Contextual Notes

Participants highlight limitations in the reliability of certain measurement techniques and the challenges posed by correlation in experimental data. There is also uncertainty regarding the effectiveness of fractal and Hurst analysis in this context.

Who May Find This Useful

This discussion may be of interest to researchers and practitioners in materials science, surface physics, and applied mathematics, particularly those focused on surface characterization techniques in epitaxial systems.

baffledMatt
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Does anybody know any neat measurements one can do to characterise a surface? I'm thinking generally of rough surfaces such as the ones you come across in epitaxial systems.

In other words:
If I have two ensembles of surfaces, what is the best method to use to determine whether the same growth process was used for each ensemble?

The ideas I have so far are:
Power spectrum
Wavelet analysis

but these can be unreliable as it is quite easy to make two different processes create very similar looking power spectra, etc. This makes life especially difficult with experimental data because you generally don't have the statistics you would like.

Also, does anybody know anything about what resampling methods exist for this type of scenario? I have seen people who scan lines across the surface and take separate measurements for each one, then do exactly the same thing again but with the lines going at right angles to the first ones. Due to the huge amount of correlation, this method seems dodgy as hell to me.

Matt
 
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I'm not sure exactly what you are trying to achieve here but you could look at the following :

auger spectroscopy(AES), STM, XPS, SIMS - these are commonly used for surface characterization
 
Thanks, but I'm more looking for theoretical techniques to analyse my data.

I have measurements of some rough surfaces in the form [tex]h(x,y)[/tex], which is the height at a given (x,y) coordinate (x,y is in the plane of the surface) and I want to compare them to similar surfaces generated on a computer.

Matt
 
Mandelbrot used fractals to characterize roughness. Don't ask me how that one works.
 
Simon666 said:
Mandelbrot used fractals to characterize roughness. Don't ask me how that one works.

Yeah, I discussed this problem with him last week and he thinks that the best thing is to use Hurst analysis. I'm just not so sure because this sort of thing amounts to trying to decide if one straight line on a log-log plot is the same as another straight line on a log-log plot (which is how we determine the Hurst exponent) It's all just a little unsatisfying really.

Matt
 

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