Nov17-10, 08:00 PM
I am trying to decide what to focus on for my final project in my experimental physics class. I will be investigating various properties of semiconductors using atomic force microscopy.
I have only used an AFM to investigate two other samples, gold and silicon dioxide. Important characteristics we investigated for those included grain size, PSD, ACF, and RMS roughness. I would like to investigate something more than just these properties for the semiconductor sample - it's my final project.
Does anyone have an idea of what interesting angles I could take for this semiconductor AFM project? I don't know much about them.
By the way, I only have a day or two in the AFM lab to take data.
P.S. I am one of three undergrads in this graduate physics class, and we'll be presenting our findings in class.... so I want to WOW them! At least a little. :)
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