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Ellipsometry analysis-need help

  1. Jan 1, 2008 #1
    hi all
    im trying to solve this exercise of ellipsometry.
    given:
    the figure show the spectrum of ellipsometry of a twoo thin films Si3N4 and Si deposed on a substrat of INP.
    in which order are deposed those thin films: 1- Si3N4/Si/InP
    or 2- Si/Si3N4/InP
    need justification.


    here are the figures in the attachement ( figure 1, 2 and 3)
     

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    • 2.jpg
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    • 3.jpg
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  2. jcsd
  3. Jan 1, 2008 #2
    none know about it??
     
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