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Interpreting Seidel Aberration coefficients

  1. Mar 26, 2015 #1
    I am trying to model a simple system, but the ray-tracing does not seem to be consistent with the analysis of the system in terms of Seidel aberration values. Here's the system layout:
    RtkkG.png
    When the system contains only the Eye model and the OL lens, it can be referred from the Seidel diagram that the SUM of the aberrations at IM1 for field curvature and distortion are +9um and -19um respectively. It can seen that the peripheral rays' focus is lagging the paraxial focus - thus, the image is not flat:
    H2888.jpg
    Then, when I add the achromatic pairs P1 and P2, the new image is at surface Im2, the new SUM of Seidel coefficients for filed curvature and distortion are +13 and -20 respectively:
    WjNZD.jpg
    Thus, I would expect the IM2 surface to be even more curved, however, looking at the IM2 plane ray diagram, the peripheral points seem to focus much closer to the paraxial image plane - thus, the field curvature seems to be much smaller. So, the question is why the Seidel coefficients for filed curvature for IM2 are larger than for IM1, but the apparent ray-tracing shows smaller filed curvature in IM2 (which is expected to be larger than in IM1)?
     
  2. jcsd
  3. Mar 31, 2015 #2
    Thanks for the post! This is an automated courtesy bump. Sorry you aren't generating responses at the moment. Do you have any further information, come to any new conclusions or is it possible to reword the post?
     
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