Scanning Tunneling Microscope Question (introductory modern physics)

In summary: Your Name]In summary, an STM uses tunneling current to create images of surface features by measuring the current through the tip at different distances from the sample surface. The tunneling probability formula, n=(h bar)/sqrt(2m(U-E)), relates the probability of electron tunneling to the distance between the tip and the sample surface. To solve the given problem, we can use the formula I/I0 = e^(-2nd) to calculate the ratio of current at two different distances and determine the sensitivity of the current to the distance between the tip and the sample surface.
  • #1
Potato21
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Homework Statement



A scanning tunneling microscope (STM) can precisely determine the depths of surface features because the current through its tip is very sensitive to differences in the width of the gap between the tip and the sample surface. Assume that in this direction the electron wave function falls off exponentially with a decay length of 0.124 nm - that is with C=8.06 nm-1. Determine the ratio of the current when the STM tip is 0.488 nm above a surface feature to the current when the tip is 0.516 nm above the surface.

Homework Equations



I honestly don't have any idea, the question appears foreign to me. If anything that the penetration depth formula n=(h bar)/sqrt(2m(U-E)) but I don't see how to use it. I'm completely lost


The Attempt at a Solution



I don't really understand what its about so I haven't attempted a solution. The textbook we're using (Knight) doesn't cover any questions like it either. Help!

Thank you in advance.
 
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  • #2


Hello,

I understand your confusion with this question, it can seem quite daunting at first. The key to solving this problem is understanding the concept of tunneling current in an STM and how it relates to the distance between the tip and the sample surface.

In an STM, a voltage is applied between the tip and the sample, creating a potential difference. This potential difference allows electrons to tunnel through the gap between the tip and the sample surface. The current through the tip is then measured and used to create an image of the surface features.

The formula you mentioned, n=(h bar)/sqrt(2m(U-E)), is known as the tunneling probability formula. It relates the probability of an electron tunneling through a barrier to the distance between the tip and the sample surface, represented by n. In this case, n is equal to the decay length of 0.124 nm.

To solve this problem, we need to use the ratio of the tunneling probabilities at two different distances, 0.488 nm and 0.516 nm. This can be calculated using the formula: I/I0 = e^(-2nd), where I is the current at a distance d and I0 is the current at a reference distance (in this case, 0.516 nm).

Using this formula, we can calculate the ratio of the current at 0.488 nm (I) to the current at 0.516 nm (I0). This ratio will give us the answer to the question, as it represents the sensitivity of the current to the distance between the tip and the sample surface.

I hope this helps you understand the problem better and gives you a starting point to solve it. If you have any further questions, please don't hesitate to ask.


 

1. What is a Scanning Tunneling Microscope (STM)?

A Scanning Tunneling Microscope (STM) is a scientific instrument used to study the surface of materials at the atomic level. It uses a sharp tip to scan over the surface of a sample, measuring the flow of electrons between the tip and the sample. This allows for the visualization and manipulation of individual atoms and molecules.

2. How does a Scanning Tunneling Microscope work?

The STM works by applying a small voltage between the tip and the sample. As the tip scans over the surface, electrons can tunnel through the small gap between the tip and the sample. The resulting tunneling current is measured and used to create an image of the surface. The tip is then moved in a raster pattern to create a full image of the surface.

3. What are the advantages of using a Scanning Tunneling Microscope?

One major advantage of using an STM is its ability to image and manipulate materials at the atomic level. This allows for a deeper understanding of the surface properties of materials, which is crucial in fields such as materials science and nanotechnology. Additionally, STMs are relatively easy to use and can produce high-resolution images quickly.

4. What are the limitations of a Scanning Tunneling Microscope?

One limitation of STMs is that they can only be used on conductive materials, as the flow of electrons is necessary for the tunneling current to be measured. Additionally, the sample must be stable and relatively flat, as any vibrations or irregularities can affect the accuracy of the images produced. STMs also have a limited scanning range, typically only a few hundred nanometers.

5. What are some real-world applications of Scanning Tunneling Microscopes?

STMs have numerous applications in various fields of science and technology. They are commonly used in materials science to study the surface properties of materials, in nanotechnology for the manipulation and assembly of nanoparticles, and in biology to study the structure of biomolecules. STMs have also been used in the development of new technologies, such as data storage devices and solar cells.

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