Which materials are responsible for the peaks in this X-ray diffraction pattern?

In summary, to find which elements and planes the intensity peaks in the graph come from, you will need to calculate the d-spacing for each material and compare it to the d-spacing of the peaks in the graph. The materials that are likely to be found are nickel, iron, silicon, graphite, and copper. The Bragg's law equation can be used to calculate d-spacing, and n represents the order of the reflection. By comparing the calculated d-spacing to the d-spacing of the peaks in the graph, you can determine which material likely caused each peak.
  • #1
superwolf
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I want to find which elements and planes the intensity peaks in this graph comes from. The X-rays in the diffractometer are have a wavelength of 0.709 Å. The [tex]2 \theta[/tex] values for the peaks (including double peaks) are: 11.84, 19.56, 20.04, 23.28, 33.88 and 39.16.

Nickel, iron, silicon, graphite and copper are the materials I am likely to find.


Bragg's law:

[tex]
2dsin \theta = n \lambda
[/tex]

What should I do? Calculate d?

[tex]
d = \frac{n \lambda}{2 sin \theta_{hkl}}
[/tex]

What is n?

Here are some data:
Nickel: http://rruff.geo.arizona.edu/AMS/xtal_data/DIFfiles/10253.txt
Graphite: http://rruff.geo.arizona.edu/AMS/xtal_data/DIFfiles/11023.txt
Silicon: http://rruff.geo.arizona.edu/AMS/xtal_data/DIFfiles/10342.txt
Copper: http://rruff.geo.arizona.edu/AMS/xtal_data/DIFfiles/13267.txt
Iron: http://rruff.geo.arizona.edu/AMS/xtal_data/DIFfiles/00669.txt
 
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  • #2
n is the order of the reflection. It is usually 1, but it can also be higher. For each peak, you need to calculate the d-spacing for each material and then compare it to the d-spacing of the peaks in the graph. If the calculated d-spacing for a material matches the d-spacing of the peak, then this means that the peak was likely caused by that material.
 

1. What is an X-ray diffraction pattern?

An X-ray diffraction pattern is a visual representation of the diffraction of X-rays by a crystalline material. It shows the positions and intensities of the diffracted X-ray beams, which can be used to determine the structure and composition of the material.

2. How is an X-ray diffraction pattern produced?

An X-ray diffraction pattern is produced when a beam of X-rays is directed at a crystalline material. The X-rays are diffracted by the crystal lattice, resulting in a pattern of spots on a photographic film or detector.

3. What information can be obtained from an X-ray diffraction pattern?

An X-ray diffraction pattern can provide information about the crystal structure, lattice spacing, and orientation of the material. It can also be used to identify the type of crystal and determine its purity.

4. What is the significance of the peaks in an X-ray diffraction pattern?

The peaks in an X-ray diffraction pattern represent the angles at which the diffracted X-rays were scattered. The positions and intensities of these peaks can be used to determine the crystal structure and composition of the material.

5. How is an X-ray diffraction pattern analyzed?

An X-ray diffraction pattern is typically analyzed using specialized software that can identify and measure the positions and intensities of the peaks. This data can then be compared to known patterns and structures to determine the properties of the material.

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