Recent content by Hanyuri
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Graduate Questions on Rs measurement by four point probe device
Hi all, I am working on electronics material (using metal oxide as an active layer in TFTs). Currently, I'm trying to measure the sheet resistance (Rs) of CuO thin film (~100nm in thickness). My lab uses Agilent B1500 device for measuring the Rs. I met some problems when carrying out the...- Hanyuri
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- Device Measurement Point Probe Thin film
- Replies: 1
- Forum: Atomic and Condensed Matter