High rez electromagnetic field mapping

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Discussion Overview

The discussion revolves around the challenge of mapping electromagnetic fields in a detailed manner, particularly in the context of experiments involving crystallized metal samples. Participants explore methods for achieving higher resolution in electromagnetic field mapping, including both 2D and 3D approaches, while considering the influence of environmental factors.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested
  • Experimental/applied

Main Points Raised

  • One participant seeks a method to create a detailed map of an electromagnetic field induced in a metal sample, expressing dissatisfaction with basic 2D approaches using conductivity paper and Ag ink.
  • Another participant suggests that the problem is complex and that there is no standard method for such measurements, recommending the use of simulation programs for Finite Element problems.
  • A participant inquires about the existence of common devices used in physics for 3D electromagnetic field mapping, expressing a belief that such methods must exist in large universities.
  • One participant mentions using a technique called SNOM for measuring optical electromagnetic fields but notes its unsuitability for DC fields, and asks about the required resolution for the mapping.
  • The original poster indicates uncertainty about the necessary level of detail, stating the goal is to distinguish between crystallized and non-crystallized samples based on their electromagnetic signatures.

Areas of Agreement / Disagreement

Participants do not appear to reach a consensus on the methods or devices available for detailed electromagnetic field mapping, and multiple competing views on the complexity of the problem and potential solutions remain present.

Contextual Notes

The discussion highlights limitations regarding the availability of standard methods for precise electromagnetic field mapping and the potential need for shielding against environmental fields. There is also uncertainty about the required resolution for effective differentiation between sample types.

Who May Find This Useful

This discussion may be of interest to researchers and practitioners in experimental physics, materials science, and engineering, particularly those focused on electromagnetic field measurements and characterization of materials.

veld
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Greetings, I am currently working on an interesting experiment on crystalized metal and I need to find a way to get a detailed map of an electromagnetic field when current is induced into a metal sample. I found the basic 2D approach of using conductivity paper and Ag ink to be useless as it produces very crude results. I am looking for a way to yield more detail with fine lines that will show greater characteristics from my sample. A 3D map would be a good start I would think. I also would think such a fine mapping would be sensitive to environmental fields such as the Earths magnetic field, so I am guessing the experiment will need to be shielded in some way. Does anyone know how I can do this? Sorry I am not a physicist so I am not familiar what is used when they need to do this type of work. Thanks in advance for any suggestions.
 
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This is an extremely complex problem, there is no standard way of performing this type of measurement.

The best you might be able to do is enlist the help of someone with a bit of expertise in writing simulation programs for Finite Element problems. There may also be software packages available that can also perform this kind of simulation.

Claude.
 
Thanks Claude for the reply.

I would think there was some common device used in physics to collect a 3D image of EM fields, but I guess I am wrong. I am sure the large universities must have such a method or device to do this.

Well then is there a device that can do a more precise 2D mapping?
 
I use a technique called SNOM to measure optical electromagnetic fields, however this wouldn't be suitable for DC fields. How small do you need the resolution to be?

Claude.
 
Good question, I am really not sure how detailed ill need. My objective is to keep trying better and better measurements until I can tell the difference between a crystalized and non crystalized sample from just its EM signature.
-Dan
 

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