I'm trying to obtain the free carrier concentration vs depth profile from the CV (capacitance-voltage) measurements of a normally-on HEMT with the expressions used for a Schottky barrier, but I´'m confused about how to extract the values for depth. I found in textbooks and articles that the...
Hi!
How can I tell, based on my Raman and X-Ray Diffraction studies, if a thin film is nanocrystalline or amorphous?
The maximum thickness of my films is about 200nm, the XRay diffractograms showed nothing but the substrate (is it because of the thickness?), and my Raman spectra showed some...