Recent content by jcli0002
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Graduate XRD FWHM, debye-scherrer's formula & AFM surface morphology
Hi guys, I have an question about the correlation between grain size caculated from debye-scherrer and the AFM results for my AlN epi layer samples. From my AFM results, the trend of grain size of three samples are getting smaller( around 200-10 nm range among three samples). but the FWHM of...- jcli0002
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- Formula Fwhm Surface Xrd
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- Forum: Atomic and Condensed Matter