 Quote by v6WR5Pfk6Jm4
But that still leaves me with the same question... What if we 'measure' every single one these electrons/photons before during or after the slits, we wouldn't see interface in any of these situations right?. So why isnt the conclusion that the measures are simple 'converting' it into particles?
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When this test is done with polarized light, you can see why this view can be eliminated. Have the source light polarized at 45 degrees. Place a polarizer in front of the left slit oriented at 0 degrees. Place another polarizer in front of the right slit also oriented at 0 degrees. RESULT: no information is gained when light comes through the slits as to which slit the photon passed through. Therefore, an interference pattern IS seen.
Change the polarizer in front of the right slit to be oriented at 90 degrees. The photon can now only go through the left slit OR the right slit, but NOT BOTH. Further, if you were to measure the polarization of the photon when it hits the screen, you would know which slit the photon went through. You don't actually need to do this, it is enough that you could. RESULT: information IS gained when light comes through the slits as to which slit the photon passed through. Therefore, NO interference pattern is seen.
Obviously, the only change is the orientation of a polarizer and that is sufficient to change the results from interference to no interference. So that does not correspond to your hypothesis. Because the same kinds of measurements are happening regardless of polarizer orientation!