Thanks for the help. I'm not completely sure whether the terminology is exactly the same, but I did a quick calculation where I use the total scattering cross section of Si at the given energy. This seems to be sort of the same as the extinction coefficient from what I gather. For a density, ρ...
Think I can help with some of your questions, I'm sure I will be corrected where I'm wrong.
1. In regular XRD-measurements, the detector is usually positioned so that only elastically scattered photons are detected (Bragg-Brentano geometry). The elastic scattering process is called Thomson...
I am intending to perform extended absorption fine structure (EXAFS) experiments on a thin film in order to investigate the near order around Europium ions. The thin film is going to be deposited on a silicon substrate, and the question is in reality related to how thick the substrate should be...