Scanning Tunneling Microscopy (STM) is a technique that provides atomic-scale imaging of conducting materials. It operates by utilizing an atomically sharp metal tip positioned close to the sample surface, where a tunneling current is generated when a voltage is applied. The current's magnitude varies with the distance between the tip and the surface, allowing for a topographic map to be created as the tip is rastered across the surface. IBM Almaden Labs employs STM for materials synthesis, showcasing its versatility beyond imaging.
PREREQUISITESResearchers, physicists, and materials scientists interested in atomic-scale imaging and the applications of Scanning Tunneling Microscopy in materials synthesis and surface analysis.
Scanning-tunneling microscopy (STM) can image surfaces of conducting materials with atomic-scale resolution. It uses an atomically-sharp metal tip that is brought very close to the surface. When the tip and sample are connected with a voltage source, a small tunneling current flows between the tip and sample surface. This current can be measured, and the magnitude depends on the distance between the tip and the surface. As the tip is moved laterally across the surface, a feedback mechanism moves the tip up and down to maintain a constant tunneling current. Rastering the tip across the surface therefore produces a topographic map of the surface.