A Scanning Tunneling Microscope (STM) is a type of microscope that uses a sharp metal tip to scan the surface of a material at the atomic level. It measures the tunneling current between the tip and the surface, producing a 3D image of the surface.
An STM works by applying a voltage between the metal tip and the surface of the material. This creates a tunneling current between the two, which is then measured and used to create an image of the surface. The tip is scanned across the surface in a raster pattern, creating a 3D image.
An I-V curve, also known as a current-voltage curve, is a graphical representation of the relationship between the voltage and current in an STM. It shows how the current changes as the voltage is varied, providing valuable information about the electrical properties of the material being scanned.
STMs are commonly used in scientific research to study the surface of materials at the atomic level. They can provide information about the topography, electronic properties, and chemical composition of a material. This information is crucial in fields such as nanotechnology, materials science, and surface physics.
STMs have several advantages over other types of microscopes. They can achieve much higher resolution, up to atomic levels, and can also operate in various environments, including vacuum, air, and liquids. Additionally, STMs do not require staining or preparation of samples, making them ideal for studying delicate or sensitive materials.