SUMMARY
The historical measurement of electronics propagation delay, particularly for transistors, evolved significantly over time. Initially, techniques such as time domain reflectometry (TDR) and the use of mechanical oscilloscopes were employed, with TDR resolving delays to about 30 picoseconds by the 1970s. The introduction of ring oscillators, utilizing odd numbers of inverters, allowed for precise measurements of propagation delay, with frequencies easily measurable in the megahertz range. Early methods included the use of syphon recorders for telegraph cables and Lecher lines for microwave frequencies, demonstrating the innovative approaches taken before modern digital oscilloscopes became prevalent.
PREREQUISITES
- Understanding of propagation delay in electronics
- Familiarity with ring oscillators and inverter circuits
- Knowledge of time domain reflectometry (TDR)
- Basic principles of mechanical oscilloscopes and their historical context
NEXT STEPS
- Research the principles of time domain reflectometry (TDR) and its applications in modern electronics
- Explore the design and function of ring oscillators in measuring propagation delay
- Investigate the historical development of mechanical oscilloscopes and their impact on electronics measurement
- Learn about Lecher lines and their role in measuring microwave frequencies
USEFUL FOR
Electronics engineers, historians of technology, and students studying the evolution of measurement techniques in electronics will benefit from this discussion.