SUMMARY
The discussion focuses on the peak matching process in X-ray Diffraction (XRD) analysis specifically for Zinc Oxide (ZnO). Users are advised to utilize modern systems with integrated detectors and software like X'PERT Quantify for efficient peak identification. Key steps include background removal, application of line smoothing functions, and correlation of expected elements with detected peaks. For traditional methods, measuring diffraction cone spacings and consulting inorganic phase indexes are necessary for peak matching.
PREREQUISITES
- Understanding of X-ray Diffraction (XRD) techniques
- Familiarity with X'PERT Quantify software
- Knowledge of peak identification and analysis methods
- Basic principles of crystallography and planar spacing calculations
NEXT STEPS
- Research advanced features of X'PERT Quantify for peak analysis
- Learn about the Debye-Scherrer Camera method for XRD
- Explore literature on ZnO characterization using XRD
- Study the impact of sample preparation on XRD results
USEFUL FOR
Researchers, materials scientists, and laboratory technicians involved in XRD analysis and characterization of materials, particularly those working with Zinc Oxide.