Discussion Overview
The discussion revolves around the challenges faced in measuring the BET surface area of reduced graphene oxide (rGO) thin films using gas adsorption techniques. Participants explore potential reasons for obtaining negative volumes of adsorbate during nitrogen adsorption isotherm measurements, including sample preparation and apparatus issues.
Discussion Character
- Technical explanation
- Debate/contested
- Experimental/applied
Main Points Raised
- One participant reports negative volumes of nitrogen adsorbed during measurements, despite proper sample preparation and degassing.
- Another participant suggests checking for air leaks in the apparatus, as this could lead to inaccurate adsorption values.
- A participant expresses confidence in the absence of leaks, citing successful tests with activated carbon, and proposes that thermal or diffusion issues may be affecting the rGO sample.
- Concerns are raised about the appropriateness of using activated carbon for leak testing due to its high specific surface area, which could mask leak effects.
- Suggestions include extending the degassing time and mixing the rGO sample with an inert powder to improve heat transfer and obtain more reliable adsorption results.
- Participants discuss the possibility of graphene sheets restacking, which could affect the expected surface area of the rGO material.
Areas of Agreement / Disagreement
Participants do not reach a consensus on the cause of the negative adsorption values. Multiple competing views regarding potential issues with the sample and the measurement apparatus remain present.
Contextual Notes
Participants mention the importance of sample preparation and the potential impact of thermal conditions and diffusion on the adsorption measurements. There is uncertainty regarding the specific surface area of the rGO and the effects of sample outgassing.
Who May Find This Useful
Researchers and practitioners involved in material science, specifically those working with gas adsorption techniques and surface area measurements of nanomaterials.