Radiation Hard Electronic Design for LVO Long Mission

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SUMMARY

The discussion focuses on the challenges of designing radiation-hardened electronics for long-duration missions in Low Venus Orbit (LVO), particularly in relation to Galactic Cosmic Rays (GCRs). Standard radiation-hard components with a Single Event Latchup (SEL) immunity rating of LET = 85 MeV-cm²/mg are deemed insufficient for the harsher radiation environment of Venus. Participants emphasize the need for additional protective measures against latch-up conditions, which are typically not prioritized in Low Earth Orbit (LEO) designs. Key references include studies on the Venus radiation environment and the implications for mission design.

PREREQUISITES
  • Understanding of Galactic Cosmic Rays (GCRs) and their effects on electronics
  • Familiarity with radiation-hard electronic components and their specifications
  • Knowledge of Single Event Latchup (SEL) and Single Event Upset (SEU) phenomena
  • Basic principles of space mission design and radiation environment assessment
NEXT STEPS
  • Research the Venus Radiation Environment Monitor (VeRad) for insights on radiation levels
  • Study the implications of cosmic-ray induced radiation doses on habitability
  • Examine design strategies for enhancing SEL immunity in electronic components
  • Explore long-duration mission planning in high-radiation environments
USEFUL FOR

Aerospace engineers, electronic design engineers, mission planners, and researchers focused on space exploration and radiation effects on electronics.

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TL;DR
For std LEO electronic design, the modern radiation-hard components with a Single Event Latchup (SEL) Immune to LET = 85 MeV-cm2/mg are in a safe condition. What about for a Venus mission?
Venus does not have a magnetosphere, so the Galactic Cosmic Rays (GCRs) environment shall be much worse than in a LEO environment. Looking to the std radiation models for Venus, the standard radiation-hard space level electronic component with tested immunity LET = 85 MeV-cm2/mg seems not enough, so, for example, a 1cm2 Si die will suffer considerable flux above this level during a long mission (10 years for example). So, the question is, usually we are not paying attention to latch-up condition for LEO designs, as using tested immunity LET = 85 MeV-cm2/mg, but for a venus mission (LVO), shall be design be different, including additional protection against Latchup? Thank you!!!
 
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Arend said:
TL;DR Summary: For std LEO electronic design, the modern radiation-hard components with a Single Event Latchup (SEL) Immune to LET = 85 MeV-cm2/mg are in a safe condition. What about for a Venus mission?

venus mission (LVO),
LVO = Low Venus Orbit?

What references has one found regarding the radiation environment around Venus, or at

For example:

Venus Radiation environment monitor (VeRad) for the Venus Orbiter Mission
https://ui.adsabs.harvard.edu/abs/2022cosp...44..331S/abstract

Revisiting the cosmic-ray induced Venusian radiation dose in the context of habitability
https://www.aanda.org/articles/aa/full_html/2020/01/aa36968-19/aa36968-19.html

Ionization of the venusian atmosphere from solar and galactic cosmic rays
https://www.sciencedirect.com/science/article/pii/S0019103514004941

Venus has an orbit with a semi-major axis of 0.723 au (108,200,000 km; 67,200,000 mi), and an eccentricity of 0.007. Ref: https://en.wikipedia.org/wiki/Orbit_of_Venus

https://angeo.copernicus.org/articles/34/595/2016/angeo-34-595-2016.pdf

Galactic Cosmic Rays at Mars and Venus: Temporal Variations from Hours to Decades
Measured as the Background Signal of Onboard Microchannel Plates
https://iopscience.iop.org/article/10.3847/1538-4357/ac9a49/pdf

For those not familiar with SEU or SEL. (single event upset or latchup)
https://en.wikipedia.org/wiki/Latch-up

https://www.ti.com/lit/rr/slvk043a/slvk043a.pdf?ts=1760173958547

https://www.doeeet.com/content/eee-...ion/single-event-latchup-protection-circuits/
 
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A Venus mission doesn't have anything you don't see in LEO. The radiation is just more intense:
* You accumulate an integrated dose quicker - but longer missions in Earth orbit can end up with the same.
* You get a higher rate of single event upsets. Plan the electronics accordingly.
 

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