Uncertainties in Poisson processes

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    Poisson Uncertainties
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Discussion Overview

The discussion revolves around uncertainties in measurements taken with optical detectors, specifically in the context of characterizing quantum efficiency and the statistical properties of photon counts recorded by these detectors. Participants explore methods for estimating uncertainty in repeated measurements of photon counts, considering both Poisson processes and additional noise sources.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested
  • Mathematical reasoning

Main Points Raised

  • One participant describes a scenario involving repeated measurements of photon counts from a single large pixel detector and seeks clarification on how to calculate uncertainty associated with these measurements.
  • Another participant suggests that for large counts, the standard deviation can be approximated using the square root of the number of counts, while also noting that for smaller counts, the distribution may be skewed, necessitating alternative statistical measures.
  • A later reply emphasizes the importance of considering additional noise sources beyond shot noise, such as dark current and amplifier noise, which may affect the overall measurement uncertainty.
  • Further, a participant questions whether the previous advice regarding shot noise remains valid in the context of a specific type of detector (Single Photon Avalanche Diodes) that is claimed to be shot noise-limited.

Areas of Agreement / Disagreement

Participants express differing views on the appropriate methods for estimating uncertainty, with some advocating for the use of standard deviation and others emphasizing the need to account for various noise sources. The discussion remains unresolved regarding the best approach to quantify uncertainty in this context.

Contextual Notes

Participants highlight the dependence of uncertainty calculations on the assumptions made about the detector's noise characteristics and the statistical properties of the photon counts. There is an acknowledgment of the limitations in the discussion regarding the specific conditions under which different methods may apply.

marco1235
Good morning PF,

I'm feeling a bit doubtful about this issue. I'm working with optical detectors and I have to characterize them in terms of quantum efficiency and other similar things. Now suppose my detector is, ideally, a single large pixel, which I illuminate for a specific time. Then I store the recorded Nphotons and repeat the procedure for 10k times! At each iteration, due to the randomness of the process I can get 100 counts in the first step, 102 at the second, 95, 87, 101, 106, ... an so on.
I want to make an average of such 10k values, and that's fine. But how about the uncertainty associated with this repeated measure? I have two ways:
1) computing the standard deviation using std-like function (Matlab)
2) putting Navg as argument of the squared-root like in Poisson processes

I'm really stucked in this situation.
Hope someone could help me!
Have a nice day
 
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n data points from a poisson distribution are approximately normal for large n (standard deviation ##\sqrt{n}##.
If you have small numbers, then the distributon is strongly skewed and you'll need median and quartiles or some other way to account for skewdness.
So - if you have sufficiently large counts, you want option 2... though either should work.
 
Thank you so much! it helped a lot :)
 
marco1235 said:
But how about the uncertainty associated with this repeated measure?

It's not clear what you are really asking or trying to characterize- Simon Bridge's response refers only to the noise associated with incoherent photons (thermal light or 'shot noise'), but you have other noise sources: dark current, amplifier noise... Your measurement contains all of these noise sources, which are hopefully independent from each other. Hamamatsu has some very read-able references on this issue:

http://www.hamamatsu.com/jp/en/community/optical_sensors/all_sensors/guide_to_detector_selection/index.html
http://www.hamamatsu.com/jp/en/community/optical_sensors/sipm/measuring_mppc/index.html
http://www.hamamatsu.com/jp/en/community/optical_sensors/all_sensors/index.html
http://www.hamamatsu.com/resources/pdf/ssd/e05_handbook_image_sensors.pdf
 
Last edited by a moderator:
Dear Andy,

thank you for your answer. You're right, probably I went a bit faster.. in case of an ideal detector (so only shot noise-limited) and photons coming out from a fluorescent specimen, is Simon's reply still valid? In real life my detector is a camera based on Single Photon Avalanche Diodes, and the designers told me that the sensor is only shot noise-limited, since SPADs are able to produce mA range currents upon photo-detection, and thus there's not the need of gain steps like in other optical sensor..
 

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