Does a Detector Alter Diffraction Patterns in the Two-Slit Experiment?

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SUMMARY

The two-slit experiment demonstrates that when "which path information" is available, the wave interference pattern disappears, resulting in a distinct lack of interference typically observed with both slits open. However, a single slit can still produce a diffraction pattern if the measurement does not provide precise positional information about the particle. The degree of diffraction or interference is inversely proportional to the precision of the particle's location measurement, indicating a complex relationship rather than a binary outcome in the presence of a detector.

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rp1220
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In the two slit experiment when which path information is present there is no wave interference pattern such as would be seen with both slits being used. When a single slit is used there is a visible diffraction pattern. Is such a pattern seen when a detector forces a one slit path in the two slit experiment ?
 
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With "which path information", you'll still see single-slit interference patterns if the measurement does not measure additional information about the precise position of the particle in the slit.
 
rp1220 said:
In the two slit experiment when which path information is present there is no wave interference pattern such as would be seen with both slits being used. When a single slit is used there is a visible diffraction pattern. Is such a pattern seen when a detector forces a one slit path in the two slit experiment ?

to add to what mfb has already said...

the degree of diffraction/interference is inversely proportional to the degree of precision/probability (of particle/photon location).

its not a yes or no, 1 or 0, interference or no-interference, which-way or no-which-way thing
 
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