High rez electromagnetic field mapping

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SUMMARY

The discussion centers on the challenge of mapping electromagnetic fields in crystalized metal samples with high precision. The initial approach using conductivity paper and Ag ink proved inadequate, prompting the search for more advanced techniques. Suggestions include utilizing simulation programs for Finite Element Analysis and exploring specialized devices for 2D and 3D electromagnetic field mapping. The goal is to distinguish between crystalized and non-crystalized samples based on their electromagnetic signatures.

PREREQUISITES
  • Understanding of electromagnetic field mapping techniques
  • Familiarity with Finite Element Analysis (FEA) software
  • Knowledge of Scanning Near-field Optical Microscopy (SNOM)
  • Basic principles of electromagnetic fields and shielding methods
NEXT STEPS
  • Research Finite Element Analysis software options for electromagnetic field simulations
  • Explore advanced 2D and 3D electromagnetic field mapping devices
  • Investigate shielding techniques to minimize environmental interference in measurements
  • Study the principles and applications of Scanning Near-field Optical Microscopy (SNOM) for electromagnetic field analysis
USEFUL FOR

Researchers in materials science, physicists, and engineers focused on electromagnetic field analysis and mapping techniques, particularly those working with crystalized materials.

veld
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Greetings, I am currently working on an interesting experiment on crystalized metal and I need to find a way to get a detailed map of an electromagnetic field when current is induced into a metal sample. I found the basic 2D approach of using conductivity paper and Ag ink to be useless as it produces very crude results. I am looking for a way to yield more detail with fine lines that will show greater characteristics from my sample. A 3D map would be a good start I would think. I also would think such a fine mapping would be sensitive to environmental fields such as the Earths magnetic field, so I am guessing the experiment will need to be shielded in some way. Does anyone know how I can do this? Sorry I am not a physicist so I am not familiar what is used when they need to do this type of work. Thanks in advance for any suggestions.
 
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This is an extremely complex problem, there is no standard way of performing this type of measurement.

The best you might be able to do is enlist the help of someone with a bit of expertise in writing simulation programs for Finite Element problems. There may also be software packages available that can also perform this kind of simulation.

Claude.
 
Thanks Claude for the reply.

I would think there was some common device used in physics to collect a 3D image of EM fields, but I guess I am wrong. I am sure the large universities must have such a method or device to do this.

Well then is there a device that can do a more precise 2D mapping?
 
I use a technique called SNOM to measure optical electromagnetic fields, however this wouldn't be suitable for DC fields. How small do you need the resolution to be?

Claude.
 
Good question, I am really not sure how detailed ill need. My objective is to keep trying better and better measurements until I can tell the difference between a crystalized and non crystalized sample from just its EM signature.
-Dan
 

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