To image a computer microchip at the micrometer level using an electron microscope, a magnification of approximately x10,000 to x100,000 is recommended. Modern scanning electron microscopes (SEMs) can easily achieve this level of magnification. While a good optical microscope can resolve features down to about 2 micrometers, the discussion highlights the shift towards low nanometer geometries in current integrated circuits. The challenge in finding specific SEM images of microchips with included magnification details is noted, suggesting a potential gap in available resources. Overall, achieving high-resolution imaging of microchips requires advanced electron microscopy techniques.