Miller indices can be determined from diffraction lines in the Debye-Scherrer method by analyzing the angles at which diffraction occurs, as these angles correspond to specific crystal planes. Each crystal plane is defined by its unique Miller indices, which are derived from the geometry of the crystal lattice. Not all combinations of Miller indices will produce observable diffraction patterns, as this depends on the crystal structure. Resources such as the provided link offer detailed explanations on how to relate diffraction angles to Miller indices. Understanding this relationship is crucial for accurately interpreting X-ray diffraction data.