Miller indices in Debye-Scherrer method

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Miller indices can be determined from diffraction lines in the Debye-Scherrer method by analyzing the angles at which diffraction occurs, as these angles correspond to specific crystal planes. Each crystal plane is defined by its unique Miller indices, which are derived from the geometry of the crystal lattice. Not all combinations of Miller indices will produce observable diffraction patterns, as this depends on the crystal structure. Resources such as the provided link offer detailed explanations on how to relate diffraction angles to Miller indices. Understanding this relationship is crucial for accurately interpreting X-ray diffraction data.
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Homework Statement


Explain how we can determine Miller indices corresponding to the diffraction lines?
Can someone explain it for me please?



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The Attempt at a Solution


 
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It comes from the fact that different diffraction lines arise from diffraction from different crystal planes in the crystal. The crystal planes are defined by their Miller indices. Look at http://www.matter.org.uk/diffraction/x-ray/powder_method.htm" and the following page for a nice explanation (page 5 and 6 seems to be about the Debye Scherrer method) on how the Miller indices can be determined from the diffraction angles.

You have to know also that not all combinations of Miller indices give rise to diffracted beams in different crystal structures.
 
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Thank you very much, the link has been very helpful!:)
 

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