Secondary ions entering a mass filter in Secondary Ion Mass Sprectrometry (SIMS)

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SUMMARY

The discussion focuses on the mechanics of secondary ions entering mass filters in Secondary Ion Mass Spectrometry (SIMS). It highlights the use of various mass filters, including quadrupole, magnetic sector, and time-of-flight (TOF) filters. The TOF method employs a reflectron to ensure that secondary ions achieve uniform energy before entering the flight tube, while the operation of magnetic sector filters in this context remains less clear. Participants seek further clarification and resources on achieving consistent energy levels for secondary ions during mass filtering.

PREREQUISITES
  • Understanding of Secondary Ion Mass Spectrometry (SIMS)
  • Familiarity with mass filter types: quadrupole, magnetic sector, and time-of-flight (TOF)
  • Knowledge of ion acceleration mechanisms in mass spectrometry
  • Basic principles of energy conservation in particle physics
NEXT STEPS
  • Research the operation principles of magnetic sector mass filters in SIMS
  • Explore the role of reflectrons in time-of-flight mass spectrometry
  • Investigate ion acceleration techniques in mass spectrometry
  • Read articles on energy uniformity in secondary ion analysis
USEFUL FOR

This discussion is beneficial for researchers and technicians in the field of mass spectrometry, particularly those working with SIMS, as well as anyone involved in the design and optimization of mass filtering systems.

Deleted member 655103
Hello,
I have a question about secondary ions entering a mass filter in Secondary Ion Mass Sprectrometry (SIMS).
We know that secondary ions are sputtered from surface of studied sample. Those secondary ions are entering a mass filter which sort them out due to their mass/charge ratio. After that they enter a deterctor.
We use quadrupole mass filters, magnetic sector filters or time-of-flight filters.
In TOF, separation of secondary ions (due to m/q ratio) follows the equation:
6e99d3b829cff9cc1d21200227a992d79d16fff6

In magnetic sector filters separation follows the equation:
2a9168ed4f7208ae94e0518561ed71166491b48a

MY QUESTION: All ions should enter the mass filter with the same energy at the same time. How is it done (we know that some secondary ions gain more energy some secondary ions gain less energy during sputtering)?
I know that TOF uses device called reflectron to this purpose but how about magnetic sector filters?
Could you please post a link to some good article explaining this problem.
Thanks a lot!
 
Last edited by a moderator:
Chemistry news on Phys.org
epsilonpi said:
All ions should enter the mass filter with the same energy at the same time.

Regarding TOF-SIMS: Before entering the "flight tube", the secondary ions are accelerated using a strong electric field so that they all have approximately the same kinetic energy.
[PDF]
TOF MS intro - Chemie Unibas
 
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