Understanding D-Spacing Variation in XRD and Thin Film Analysis

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Xrd

(Topic is misleading)

The relative height of the peaks in my XRD diffractogram are different from those given in the standard powder diffraction database (JCPDS card) for a certain oxide. Is this natural? What is the most likely explanation for the discrepancy between the obtained diffractogram from a thin film and the powder diffraction standard?
 
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This may be a silly response, but does the XRD trace account for the geometric factor in your experimental apparatus?

Geometric being the angular dependence of the intensity because of the way the instrument is constructed.

If the thin film sample is not polycrystalline, it will also be necessary to account for the multiplicity of bragg planes.
 
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