What forces are used in AFM measurements?

In summary, AFM techniques can measure interactions such as Van der Waals forces, electrostatic forces, capillary forces, and chemical bonding. Specialized cantilevers can also measure electrostatic and magnetic forces.
  • #1
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I am asked 'name 3 example of interactions that can be measured by AFM techniques', then followed by 'name 3 examples of the types of interaction forces that are measured with AFM'.

1) Aren't interactions kinda the same as interaction forces?

2) I thought there is only one force, van de Waals, and that the interaction is that of dipoles interacting with each other, what are the other two or am I missing something deeper?

Cheers
 
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  • #2
With a regular AFM you will usually have Van der Waals forces but also electrostatic forces if there is free charge on the surface (or cantilever), capillary forces from the water (or other liquids) and you may have chemical bonding (lik ein protein unfolding experiments).

By using specially designed cantilevers you can measure electrostatic and magnetic forces too (EFM and MFM).
 

1. What is the purpose of using forces in AFM measurements?

The purpose of using forces in AFM (Atomic Force Microscopy) measurements is to obtain information about the surface properties of a material. This includes the topography, mechanical, electrical, and magnetic properties of a material at the nanoscale level.

2. What are the main forces used in AFM measurements?

The main forces used in AFM measurements are van der Waals forces, electrostatic forces, and magnetic forces. These forces are responsible for the interaction between the AFM tip and the sample surface, which is then measured and mapped by the AFM.

3. How are forces measured in AFM?

Forces are measured in AFM by using a cantilever (a small beam) with a sharp tip attached to one end. As the tip scans the sample surface, the cantilever bends due to the forces between the tip and the sample. This bending is then measured by a laser beam, which is used to create an image of the surface.

4. What is the role of the AFM tip in measuring forces?

The AFM tip plays a crucial role in measuring forces in AFM. It is responsible for interacting with the sample surface and detecting the forces between them. The sharpness and stiffness of the tip are important factors that determine the sensitivity and accuracy of the AFM measurements.

5. Can different forces be measured simultaneously in AFM?

Yes, different forces can be measured simultaneously in AFM. With the use of specialized tips and advanced AFM techniques, it is possible to simultaneously measure multiple forces, such as topography, mechanical, electrical, and magnetic properties, on the same sample surface.

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