SUMMARY
The smallest particle ever detected by scientists is the electron, which has been filmed for the first time using advanced microscopy techniques. Atomic Force Microscopy (AFM) and Transmission Electron Microscopy (TEM) are key tools that have enabled the observation of atomic structures and behaviors. Discussions indicate that while atoms can be visualized, sub-atomic particles such as electrons and neutrinos represent the smallest entities detected, particularly in particle colliders. The detection of these particles raises philosophical questions about the nature of matter.
PREREQUISITES
- Understanding of Atomic Force Microscopy (AFM)
- Familiarity with Transmission Electron Microscopy (TEM)
- Knowledge of sub-atomic particles, including electrons and neutrinos
- Basic principles of quantum physics
NEXT STEPS
- Explore the principles of Atomic Force Microscopy (AFM)
- Research the applications of Transmission Electron Microscopy (TEM)
- Investigate the role of particle colliders in detecting sub-atomic particles
- Study the philosophical implications of particle physics and the concept of point particles
USEFUL FOR
Quantum physicists, materials scientists, and anyone interested in the fundamental aspects of particle physics and microscopy techniques.