The RMS value of electrons collected from a photoconductor signal is used to quantify noise because it provides a stable measure of power over time, rather than relying on peak values that can fluctuate significantly. This approach averages out random variations, offering a more consistent representation of noise, which is often assumed to follow a Gaussian distribution. However, RMS measurements may not always accurately reflect the actual noise characteristics in different applications, particularly when noise exhibits high peaks or graininess. In such cases, weighted noise measurements that incorporate filtering can provide a more accurate assessment by considering specific frequency sensitivities. Ultimately, while RMS is a fundamental tool for measuring noise, its effectiveness can vary based on the context and nature of the signal.