Discussion Overview
The discussion revolves around the observed behavior of the i_D vs V_ds/V_sd curves for the CD4007 MOSFET IC, specifically focusing on the unexpected delay in the PMOS curve compared to the NMOS curve. Participants explore the underlying reasons for this behavior, touching on concepts related to transistor operation, mobility of charge carriers, and measurement techniques.
Discussion Character
- Exploratory
- Technical explanation
- Debate/contested
- Mathematical reasoning
Main Points Raised
- One participant notes that the PMOS curve appears delayed by a few volts compared to the NMOS curve and seeks explanations for this observation.
- Another participant explains that the difference in behavior may be attributed to the higher mobility of electrons compared to holes, leading to differing slopes in the curves.
- A third participant recalls that in CMOS circuits, PMOS transistors are typically sized larger than NMOS transistors to achieve symmetry.
- One participant expresses confusion regarding the Id vs Vsd curve remaining zero until a certain threshold, questioning why this behavior occurs when compared to Id vs Vsg.
- Concerns are raised about the comparison of plots due to differing axes (I(mA) for PMOS vs Vr(mV) for NMOS), suggesting that sufficient Vgs is necessary to prevent simultaneous conduction in both types of transistors.
- A participant clarifies that a small resistor was used in series with the NMOS drain during measurements, which affects the interpretation of the current readings.
- Another participant speculates that the zero current behavior in the Id vs Vsd curve might suggest the presence of a diode in the circuit path.
Areas of Agreement / Disagreement
Participants express differing views on the reasons behind the PMOS curve's behavior, with some attributing it to charge carrier mobility while others focus on measurement techniques and circuit configuration. The discussion remains unresolved with multiple competing perspectives present.
Contextual Notes
Participants mention potential limitations in the comparison of plots due to different measurement setups and the implications of using a resistor in the NMOS measurement. There is also uncertainty regarding the interpretation of the zero current behavior in the Id vs Vsd curve.