The discussion focuses on calculating dislocation from the Williamson-Hall (WH) plot using High-Resolution X-Ray Diffraction (HRXRD) measurements. Participants emphasize the importance of plotting the Full Width at Half Maximum (FWHM) of rocking curves against Tan²(θ), where θ represents the Bragg angle. Additionally, it is crucial to account for various broadening factors such as instrument broadening, intrinsic FWHM, and sample curvature broadening to obtain accurate results.
PREREQUISITESMaterials scientists, physicists, and engineers involved in crystallography and defect analysis, particularly those working with X-ray diffraction techniques.