Can I use a lookup table to determine helium diffusion through silicon?

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Discussion Overview

The discussion centers on the diffusion of helium through silicon, particularly in the context of ion implantation and potential applications such as pre-amorphization or gettering transition metals. Participants explore the factors influencing diffusion rates, including temperature, implantation depth, and the presence of nanocavities.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested
  • Mathematical reasoning

Main Points Raised

  • One participant inquires about the diffusion rate of helium in silicon and the possibility of using lookup tables or formulas for this purpose.
  • Another participant suggests that the inquiry may relate to pre-amorphization or gettering metals, providing specific parameters such as a 30 keV beam and a typical anneal profile of 900°C for 1 hour.
  • It is noted that the minimum anneal temperature is 700°C, and that nanocavities created during the process may not be stable above 1200°C.
  • Participants discuss the weak dependence of anneal time on ion density, emphasizing the stronger influence of implantation depth and anneal temperature.
  • One participant proposes a hypothetical scenario involving a silicon sphere at 20°C with a single helium atom at the center, seeking to determine the diffusion time under these conditions.
  • Another participant expresses skepticism about helium diffusion at 20°C, suggesting that thermal movement may be insufficient without applied stress, and questions whether the silicon is polycrystalline or amorphous.
  • Concerns are raised about the potential creation of nanocavities at a 40 keV energy level, with a participant humorously acknowledging the uncertainty of their formation.
  • A rough estimate is provided, indicating that diffusion time at 20°C could be significantly longer than at higher temperatures, with a suggestion that it may take around 55 hours.
  • One participant recommends consulting the Defect and Diffusion Forum for historical data on diffusion in silicon.

Areas of Agreement / Disagreement

Participants express varying views on the conditions affecting helium diffusion, with no consensus reached on specific diffusion rates or the applicability of lookup tables. The discussion remains unresolved regarding the exact mechanisms and parameters influencing diffusion.

Contextual Notes

Limitations include the dependence on temperature and implantation depth, as well as the potential impact of nanocavities, which are not fully resolved in the discussion.

kawikdx225
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Hello all,
I need to know the rate at which Helium will diffuse through a solid, specifically silicon. Assume I accelerate and implant a He+ ion into a bulk silicon substrate. How long will it take to diffuse out of the silicon? I know it will depend on the temp of Si and the depth of penetration but is there a lookup table or formula I could use?

Thanks
 
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I'm guessing this is either for a pre-amorphization step or for gettering transition metals from Si, by creating nanocavities below the surface.

For a 30 keV beam at a density of about 10^17 ions/cm^2, a typical anneal profile is 900C for 1 hr.

I do not know of any tables to look up, but I can tell you the following :

1. The minimum anneal temperature is 700C.

2. If you are gettering metals by making nanocavities, these are not stable over 1200C, so that sets an upper limit.

3. The required anneal time is only a weak function of the ion density. It is a stronger function of the implantation depth (or the ion KE) and the anneal temperature. If you can not find tables, you can crudely extrapolate from the single data point, using some simplistic model for gas diffusion in a solid.
 
Gokul43201 said:
I'm guessing this is either for a pre-amorphization step or for gettering transition metals from Si, by creating nanocavities below the surface.
The implantation of He into Si is a side effect of our tool that we are trying to characterize.

Gokul43201 said:
For a 30 keV beam at a density of about 10^17 ions/cm^2, a typical anneal profile is 900C for 1 hr.
This is done at room temperature with a 40KeV He+ ion.

Gokul43201 said:
I do not know of any tables to look up, but I can tell you the following :

1. The minimum anneal temperature is 700C.

2. If you are gettering metals by making nanocavities, these are not stable over 1200C, so that sets an upper limit.

3. The required anneal time is only a weak function of the ion density. It is a stronger function of the implantation depth (or the ion KE) and the anneal temperature. If you can not find tables, you can crudely extrapolate from the single data point, using some simplistic model for gas diffusion in a solid.
There is no annealing and we sure hope there are no nanocavities created by this process lol.

Lets assume I have a silicon sphere at 20C with a diameter of 1mm and I place a single He atom at the center. I need to know how long will it take for the He atom to diffuse through the silicon.
 
Try this reference - http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JCPSA6000041000004001018000001&idtype=cvips&gifs=yes

At 20°C, I doubt the He atom would diffuse, at least thermally. It might move with dislocation glide, but this requires application of stress.

As Gokul alludes to, there is usually a threshold temperature, however I am not sure what it might be.

Are you working with polycrystalline or amorphous Si?
 
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kawikdx225 said:
This is done at room temperature with a 40KeV He+ ion.
At this energy, I suspect you might make nanocavities unless you do a subsequent high temperature anneal.

There is no annealing and we sure hope there are no nanocavities created by this process lol.
Uh oh...I can keep my fingers crossed, but that's not likely to help much.

Lets assume I have a silicon sphere at 20C with a diameter of 1mm and I place a single He atom at the center. I need to know how long will it take for the He atom to diffuse through the silicon.
At 900C, if the diffusion time is of order 1 hour, then at 20C the diffusion time will be of order 55 hrs !
 
Thanks for all your help. :smile:
 
Try looking at the Defect and Diffusion Forum website. This journal has been collecting data on diffusion in silicon since the 1960s!
 

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