SUMMARY
The density of states (DOS) can be accurately determined from an X-ray photoelectron spectroscopy (XPS) spectrum, particularly through energy-resolved photoelectron spectroscopy. Angle-resolved photoelectron spectroscopy (ARPES) provides the band structure, which can be projected onto the energy axis to yield the DOS. However, this method primarily reveals occupied states; to investigate unoccupied states, inverse photoelectron spectroscopy (IPES) is necessary, where an electron is captured into an unoccupied state, emitting a photon with measurable energy.
PREREQUISITES
- X-ray photoelectron spectroscopy (XPS)
- Energy-resolved photoelectron spectroscopy
- Angle-resolved photoelectron spectroscopy (ARPES)
- Inverse photoelectron spectroscopy (IPES)
NEXT STEPS
- Research the principles and applications of X-ray photoelectron spectroscopy (XPS)
- Explore energy-resolved photoelectron spectroscopy techniques
- Study angle-resolved photoelectron spectroscopy (ARPES) and its data interpretation
- Learn about inverse photoelectron spectroscopy (IPES) and its role in probing unoccupied states
USEFUL FOR
Researchers in material science, physicists studying electronic properties, and anyone involved in surface analysis using X-ray photoelectron spectroscopy.