EDX vs. XPS: Which is Right for Your Application?

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SUMMARY

EDX (Energy-dispersive X-ray spectroscopy) and XPS (X-ray photoelectron spectroscopy) are distinct analytical techniques used for material characterization. EDX measures X-rays emitted from a sample, making it suitable for elemental analysis, while XPS measures photoelectrons emitted from the top 1 to 10 nm of a material, requiring ultra-high vacuum (UHV) conditions. EDX is advantageous for bulk elemental analysis, whereas XPS provides detailed chemical state information. Understanding these differences is crucial for selecting the appropriate technique for specific applications.

PREREQUISITES
  • Understanding of EDX (Energy-dispersive X-ray spectroscopy)
  • Familiarity with XPS (X-ray photoelectron spectroscopy)
  • Knowledge of ultra-high vacuum (UHV) systems
  • Basic principles of X-ray emission and photoelectron emission
NEXT STEPS
  • Research the applications of EDX in materials science
  • Explore the advantages of XPS for surface chemistry analysis
  • Learn about ultra-high vacuum (UHV) techniques and their importance in XPS
  • Investigate the differences in sample preparation for EDX and XPS
USEFUL FOR

Researchers, materials scientists, and analytical chemists seeking to understand the differences between EDX and XPS for effective material characterization and analysis.

ninthwonder
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Can someone help explain the difference between EDX(Energy-dispersive X-ray spectroscopy) vs. (XPS) X-ray photoelectron spectroscopy? Which is used for what application? Advantages/Disadvantages of each?

From what I have been reading from documentation, they seem to be the same.

Thanks.
 
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EDX/EDS measures X-rays emitted from a sample, while XPS measures photoelectrons emitted from a sample. They are somewhat related.

"Energy-dispersive X-ray spectroscopy (EDS or EDX) is an analytical technique used for the elemental analysis or chemical characterization of a sample." "To stimulate the emission of characteristic X-rays from a specimen, a high-energy beam of charged particles such as electrons or protons (see PIXE), or a beam of X-rays, is focused into the sample being studied." The process relies on the uniquness of characteristic X-rays of each element.

Ref: http://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy

http://micron.ucr.edu/public/manuals/EDS-intro.pdf

http://mee-inc.com/eds.html

http://serc.carleton.edu/research_education/geochemsheets/eds.html


X-ray photoelectron spectroscopy measures the characteristic photoelectrons emitted from a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. XPS requires ultra-high vacuum (UHV) conditions.

Ref: http://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy


http://www.phi.com/surface-analysis-techniques/xps.html

http://www.eaglabs.com/mc/x-ray-photoelectron-spectroscopy.html

http://mmrc.caltech.edu/SS_XPS/XPS_PPT/XPS_Slides.pdf
 
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