Lateral shearing interferometer

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SUMMARY

The discussion focuses on the effects of changing the shearing plate thickness in lateral shearing interferometers. It highlights that in ideal conditions, the beamsplitter operates from a single surface with an anti-reflective (AR) coating on the opposite side. The behavior of the interferometers, including Michelson and Fabry-Perot, is quantitatively explained using Fresnel coefficients, which account for the π phase change upon reflection from higher index surfaces. The conversation also clarifies that while Fresnel coefficients apply to these systems, energy reflection coefficients are not suitable for coherent beams due to the linearity of electromagnetic fields.

PREREQUISITES
  • Understanding of Fresnel coefficients
  • Knowledge of anti-reflective coatings
  • Familiarity with Michelson and Fabry-Perot interferometers
  • Basic principles of electromagnetic fields
NEXT STEPS
  • Research the impact of shearing plate thickness on interference patterns
  • Study the application of Fresnel coefficients in optical systems
  • Explore the design and function of anti-reflective coatings
  • Learn about the linearity of electromagnetic fields in coherent beam interactions
USEFUL FOR

Optical engineers, physicists, and researchers involved in the design and analysis of interferometric systems will benefit from this discussion.

henil
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what will happen to fringes if the shearing plate thickness is changed ?
 
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For interferometers, in most cases, in ideal operation, the beamsplitter works from a single surface with an AR coating applied to the other surface. For both the Michelson and Fabry-Perot and others, they are most readily explained quantitatively by the Fresnel coefficients including the ## \pi ## phase change (essentially a minus sign) that results upon reflection off of the higher index surface. The Fabry-Perot interferometer works from two reflective surfaces, but similar interference results can occur from two beams incident on a single interface from opposite directions and can be readily computed using the Fresnel coefficients. One question that often arises with these interferometers: The Fresnel coefficients always apply for these systems, whereas energy reflection coefficients can work for a single beam but do not work in the case of two incident (coherent) beams because the system is completely linear w.r.t. the electromagnetic fields but not to the energy which is proportional to the second power of the electromagnetic field amplitude
 
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