Not exactly. First off, let's state that the microscope is aligned either for critical or Kohler illumination conditions. For Kohler illumination, the source is imaged at the back pupil plane of the condenser and the front focal plane of the condenser is coincident with the sample plane (Critical illumination is essentially equivalent, but the source is imaged onto the sample plane).
Then, the numerical aperture of the condenser, which is adjusted by the aperture diaphragm (located at the back pupil plane), sets the contrast of the image (under conditions where the NA of the objective is much larger than the NA of the condenser). Low condenser NA corresponds to higher low-frequency contrast but lower resolving power. The illuminated area is set by the fireld diaphragm,which is located at a plane conjugate to the sample plane: the field diaphragm is imaged onto the sample plane.
Under critical/Kohler conditions, Lamp brightness doesn't affect image quality (within reason- the color balance can also be affected), and surprisingly, condenser aberrations do not affect image quality either.
The DOF is set by the objective lens, not the condenser. Likewise, field flatness is set by the objective lens.
Are you having trouble with a particular application?