I appreciate your exchanges, people.
Going back to the resistor measurement. Imagine I want to measure a resistor's resistance, and that it's true value is 308 ohm. I use a current source giving a current of intensity 25 uA (uncertainty or standard deviation of 10%) and I measure a voltage of 7.7 mV (SD 2% as in hutchphd's example). A lucky strike, I know, this yields the true value for R, but this doesn't matter.
Out of a single measurement, Monte Carlo gives me the following histogram for R:
The obtained simulations give me that R = 308 +16 -14 ohm. I reported the median and the 68% confidence interval, but of course I can get the mean, standard deviation and any other commonly reported stats. The analytical formula tells me that R = 308 +/- 32 Ohm (it makes sense, it's slightly higher than 10% of R, which it should since the biggest uncertainty comes from the current, which is 10%). I am not sure why there is such a disparity between MC and the analytical formula, as the histogram does not differ that much from a Gaussian. I probably goofed with the confidence interval.
Anyway, if I am not doing things the wrong way, a sensitivity analysis tells me what we already knew, i.e. that the histogram will not change much even if the standard deviation of the voltage reaches 0 (for example by repeating the voltage measurement reading an infinite number of times). But it also shows the histogram of R I would get if I managed to reduce the uncertainty in the current by a factor 10 (by making 100 measurements of the current, assuming that a lot of sources of error introduced by the use of an ammeter are negligible, which is not a given in real life conditions). See it for yourself:
With MC, I have to input the probability distributions of I and V, and it turns out that if I repeat the experiment N times, the uncertainty in either I or V will decrease by a factor of sqrt(N). This is not a property of the analytical formula alone, it's just a fact about the standard deviation of the mean, I believe. So I can use this factor and repeat the sensitivity analysis by reducing the standard deviation of I and/or V as I like. In this way, I do not quite entirely see why MC gives inferior insight than the analytical formula. The more I think about it, the more I get immersed in the complexity. For example, I would never do, in real life, the 4 measurements of I and 100 measurements of V. It is not as simple as that. If, for an experiment, only V is measured and in the other experiment only I is measured, then it's probably not exactly the same setup, I am not sure if it is as easy to analyze the results from such experiments. Here in my example of a resistor of 308 ohm, it may not matter, but if the resistance was about 1 ohm, plugging an ammeter could be quite annoying and change drastically the result.
I actually enjoy this example, because it could be a real life good example, since measuring accurately a resistance is sometimes required.