Hi,
I think you can refer this paper by M. Hirose et al...In this paper, there was an analysis of Si-O-Si vibration from ATR result. I think the number of wavenumbers of FTIR and ATR is similar around 1220cm-1.
I am new to XPS Data analysis, and I have a .sle file that I got out of XPS Machine Software, and I am using CasaXPS to analyse the data. This software takes only .vms files. I want to convert the .sle to a .vms file for analysis. How or where can I do this? Any help on this will be deeply appreciated.