Thin film light interference question

In summary, the problem involves a uniform film of oil with an index of refraction of 1.31 floating on water. When sunlight is incident normally on the film, an observer finds a maximum reflected light at a wavelength of 450nm and a minimum at a wavelength of 600nm. The task is to determine the thickness of the oil film using the equations for constructive and destructive interference, which may need to be derived for this scenario. It is important to note that the indexes of refraction for the air, oil, and water are not equivalent, which may require a reversal of the equations for accurate results.
  • #1
ia22
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Homework Statement



A uniform film of oil (n=1.31) is floating on water. When sunlight in air is incident normally on the film, an observer finds that the reflected light has a maximum at wavelength (lambda) = 450nm and a minimum at wavelength (lambda) = 600nm. What is the thickness of the oil film?

Homework Equations



The light equations for constructive and destructive interference. 2t = (m + 1/2) lambda / n and 2t = m * (lambda / n)

The Attempt at a Solution



I am having difficulties knowing where to start. We haven't had a question like this before.
 
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  • #2
Welcome to PF!

You may need to be careful with the application of those equations. Under what scenario were they derived? a thin-film suspended in air?

Here's why: Let n2 be the index of refraction of the thin-film and let n1 and n3 be the indexes for other media, which may or may not be the same. Now suppose that the equations that you have quoted were derived for a thin-film suspended in air. Then n2 > n1 and n2 > n3. Now compare this with your scenario in the problem, where n1 is the air, n2 is the thin-film of oil, and n3 is water. According to my physics text, the index of refraction of water is 1.33. Thus, for this scenario, n2 > n1 and n3 > n2 and the scenarios are not equivalent. Recall that reflection off a higher-index results in a phase shift of 0.5 wavelength.

You may need to derive the equations yourself. My hunch is that you just need to reverse the equations, but I'll let you verify that on your own. Just let me know if you need further assistance.
 
  • #3


I can understand your initial confusion and difficulty in knowing where to start with this problem. However, let's break it down step by step and use some basic principles of thin film light interference to find a solution.

First, let's start with the fact that the reflected light has a maximum at 450nm and a minimum at 600nm. This means that the thickness of the oil film is causing constructive and destructive interference of the incident light at these two wavelengths. We can use the equations for constructive and destructive interference to determine the thickness of the film.

For constructive interference, we can use the equation 2t = (m + 1/2) lambda / n, where t is the thickness of the film, m is the order of the interference (in this case, m=0 since we are looking at the first maximum), lambda is the wavelength, and n is the refractive index of the film. Plugging in the values given in the problem, we get:

2t = (0 + 1/2) * 450nm / 1.31

Simplifying, we get:

2t = 171.37nm

Dividing both sides by 2, we get:

t = 85.69nm

This is the thickness of the oil film at which constructive interference occurs for light with a wavelength of 450nm.

Similarly, for destructive interference, we can use the equation 2t = m * (lambda / n). Using the same values as before, we get:

2t = m * 600nm / 1.31

Since we are looking at the first minimum, m=1. Plugging in this value, we get:

2t = 1 * 600nm / 1.31

Simplifying, we get:

2t = 458.02nm

Dividing both sides by 2, we get:

t = 229.01nm

This is the thickness of the oil film at which destructive interference occurs for light with a wavelength of 600nm.

Now, since we know that the thickness of the film is causing both constructive and destructive interference at these two wavelengths, we can assume that the thickness of the film lies somewhere between these two values. Therefore, we can take the average of these two values to get an estimate for the thickness of the film:

t = (85.69nm + 229.01nm) /
 

1. What is thin film light interference?

Thin film light interference is the phenomenon of light waves interacting with a thin layer of material, such as a soap bubble or oil slick, resulting in changes in the color or intensity of the light. This is due to the reflection and refraction of light waves as they pass through the film and interact with its thickness and properties.

2. How does thin film light interference occur?

Thin film light interference occurs when light waves strike a thin layer of material, causing some of the light to be reflected and some to be transmitted through the film. The reflected light waves can then interfere with each other, creating patterns of constructive and destructive interference that result in changes in color or intensity.

3. What factors affect thin film light interference?

The thickness and refractive index of the film, as well as the angle and color of the incident light, can all affect thin film light interference. Additionally, the properties of the material, such as its transparency and surface smoothness, can also play a role in the interference patterns that are created.

4. What are some real-world applications of thin film light interference?

Thin film light interference has many practical applications, such as in anti-reflective coatings for glasses and camera lenses, as well as in the production of colorful iridescent materials, like butterfly wings and peacock feathers. It is also used in the manufacturing of electronic devices, such as computer screens and solar cells.

5. How is thin film light interference studied and manipulated?

Scientists use various techniques, such as spectrophotometry and ellipsometry, to measure and analyze the interference patterns created by thin films. They can also manipulate the interference by changing the properties of the film, such as its thickness or refractive index, to achieve specific effects. Computer modeling and simulations are also commonly used to study and predict thin film light interference.

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