Flamel said:
Why would measuring it some other way way prevent diffraction? Don't quantum eraser experiments show that measurements can be made on a particle and will allow diffraction to occur, so long as it can't be determined which slit the particle came through?
I don't know where you are getting these ideas. The thread seems to be just repeating itself now.
You say "prevent" diffraction, but surely we are talking about a potential diffraction pattern being
destroyed by a post-slit measurement?
If you detemine which way a particle went, then you get single slit diffraction (*). If you don't you get a double-slit interference pattern. Are you confusing "diffraction" with "interference pattern"?
(*) This is the case if you measure which way non-intrusively. This is not easy to do. In the case where you have a detector after one slit, that detector will interact with 50% of the electrons. As a result those electons may not form a diffraction pattern because after they diffracted they interacted with the measuring apparatus. In the simplest case the elecrons are captured and never reach the screen; or, they may be knocked off course and form a much more random pattern all over the screen. If electrons come through a slit and are hit by a baseball bat, then no they don't form a neat single slit diffraction pattern.
But, the electrons that
aren't measured to come through that slit are indirectly measured to come through the other slit and they should form a neat single-slit diffraction pattern.
In a typical experiment, therefore, where you measure electrons after one slit, you get a combination of a neat single-slit diffraction pattern for the 50% of electrons that came through the unobserved slit and something messier for the 50% of electrons that were observed, depending on the post-slit measurement process.