A Ansys FDTD simulation for phase change due to reflection

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The discussion centers on simulating phase change due to reflection on gold using Ansys FDTD, specifically focusing on discrepancies between observed phase change tendencies and those reported in a reference paper. The setup includes a Frequency Domain Field and a Power monitor, with the light source positioned 1um above the sample. The user seeks insights to improve the simulation accuracy. Key concerns include the configuration of the E-field angle in x-polarization and the placement of monitoring equipment. Guidance from experienced users is requested to resolve these issues.
tanhanhbi
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TL;DR
I set up the FDTD simulation to simulating the phase change due to reflection of difference materials. But the result is not similar with the reference paper
Hello,

I am currently simulating phase change due to reflection on gold (Au) using Ansys FDTD. My setup includes using a Frequency Domain Field and a Power monitor to observe the angle of the E-field in x-polarization. However, the phase change tendencies I'm observing do not match those in my reference paper.
My configuration: The yellow X is Frequency Domain Field and a Power monitor. The light source is 1um above the sample and the monitor is 1um above the light source
1718535526405.png
1718535550512.png

My simulation and reference paper.
1718535779364.png
1718535801513.png

Could anyone provide insights or guidance on how to improve my simulation?

Thank you.
 

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