Factors influencing the varaiation of depletion capacitance of MOS capacitor

Click For Summary
SUMMARY

The discussion focuses on the factors influencing the variation of depletion capacitance in MOS capacitors, particularly when fabricated without a silicon dioxide oxide layer. The instability in capacitance-voltage (CV) measurements across different samples is attributed to parameters such as oxide thickness, substrate doping, fixed oxide charge, and interface trap charge. The participants recommend studying the physics of PN junctions and refer to S.M. Sze's book on device physics for a comprehensive understanding of MIS capacitors.

PREREQUISITES
  • Understanding of MOS capacitor principles
  • Knowledge of PN junction physics
  • Familiarity with capacitance-voltage (CV) measurement techniques
  • Basic concepts of semiconductor doping
NEXT STEPS
  • Study the physics of PN junctions and their characteristics
  • Learn about the impact of oxide thickness on MOS capacitor performance
  • Research fixed oxide charge and interface trap charge effects
  • Read S.M. Sze's book on device physics, focusing on the chapter about MIS capacitors
USEFUL FOR

This discussion is beneficial for electrical engineers, semiconductor physicists, and researchers involved in the fabrication and analysis of MOS capacitors and related devices.

KITTU123
Messages
1
Reaction score
0
Hi , i am interested to know physics behind MOS capacitors, on which iam currently working in . i started to fabriacate a MOS capacitor without using oxide (silicon dioxide) layer, i have read in articles that a MOS capacitor can be fabricated by using the native oxide layer ( naturally formed ) as an insulator in between the metal contact and semiconductor.i observe a relevant results (similar to MOS capacitor). but i observe that there is no stable characteristics in cv measurents from one sample to other sample.i.e especially near the depletion mode of operation the curve are approaching both towards negative direction of voltage of certain sample and the curves of other sample are approaching in positive direction of voltage.which is undesirable. can i know the reasons affecting the instability in these characteristics and methods to get a stable behaviour. please suggest me the topics along with a good book to be read , in order to understand the physics behind this.
 
Engineering news on Phys.org
Hello. You have to go through the detail of a PN junction first. Then a P+n junction. A MOS capacitor in depletion mode is almost like a P+n or N+p junction. P+ or N+ means that part is heavily doped.

MOS capacitor CV curve depends on many parameters, like oxide thickness,substrate doping, fixed oxide charge,interface trap charge, frequency of CV measurement.

S.M.SZE's book about device physics has a wonderful chapter about MIS capacitor. You can refer to that for better understanding.

Best Regards.

M.Satter.
 

Similar threads

  • · Replies 1 ·
Replies
1
Views
2K
  • · Replies 1 ·
Replies
1
Views
3K
  • · Replies 4 ·
Replies
4
Views
4K
  • · Replies 7 ·
Replies
7
Views
3K
  • · Replies 8 ·
Replies
8
Views
6K