Discussion Overview
The discussion centers around troubleshooting high emissions during CE-102 testing (MIL-STD 461) for a unit powered by a 28V DC supply. Participants explore potential causes and solutions for exceeding emission limits, considering both the design constraints of the unit and the testing setup.
Discussion Character
- Technical explanation
- Debate/contested
- Experimental/applied
Main Points Raised
- One participant seeks assistance for high emission levels during CE-102 testing and requests suggestions for potential causes and solutions.
- Several participants inquire about the unit's normal function, additional IO cables, and the specific frequencies at which emissions are failing.
- One participant suggests placing a ferrite bead on the power cable as a possible fix, while another asks for recommendations on ferrite bead values.
- Participants discuss the importance of identifying whether emissions are common mode or differential mode, with one asking for guidance on how to perform these tests.
- Concerns are raised about the potential for ground loops and the impact of wiring inside the EMC enclosure on conducted emissions.
- Suggestions include using shielded cables, improving grounding systems, and employing LC filters to reduce emissions.
- One participant notes that using twisted shielded pair cables with a common mode choke has resulted in reduced emissions.
- Another participant emphasizes the need to verify the cleanliness of the power source and check the bonding resistance to the Ground Reference Plane (GRP) as part of the troubleshooting process.
Areas of Agreement / Disagreement
Participants express a range of viewpoints on potential fixes and troubleshooting methods, with no consensus reached on a single solution or approach. Multiple competing views remain regarding the causes of high emissions and the effectiveness of suggested remedies.
Contextual Notes
Participants mention various technical checks and considerations, such as the length of the power cable, the use of appropriate LISNs, and the need for ambient scans, which may influence the effectiveness of the proposed solutions.
Who May Find This Useful
Individuals involved in EMC testing, design engineers, and those troubleshooting conducted emissions issues in electronic devices may find this discussion relevant.